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Introduction

The "Centre for X-ray Tomography" at the Ghent University (UGCT) is an open facility. We offer scientists and engineers access to nondestructive X-ray imaging and image analysis for visualizing features in the interior of objects in 2D and or 3D. Different CT instruments are available: e.g. nano-CT, micro-CT or µ-CT, medical CT, high-energy-CT, ... Different X-ray detectors allow us to match the sample or experiment to the set-up: e.g. a-Si flat panel, CMOS flat panel, low energy CCD X-ray detector, image intensifier, ...

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If you are interested in scanning your materials at our facility contact us or ask on-line for beam time.

News

9th International conference on X-ray microscopy

07/10/2009

 

Abstracts of the 9th International Conference on X-ray Microscopy (2008) are published online.

Link to article: http://www.iop.org/EJ/abstract/1742-6596/186/1/012082

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12th Euroseminar on Microscopy Applied to Building Materials

20/09/2009

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